The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2004

Filed:

Mar. 28, 2003
Applicant:
Inventors:

Ichiro Maki, Kanagawa, JP;

Hirofumi Yudahira, Hamana-gun, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/7416 ;
U.S. Cl.
CPC ...
G01N 2/7416 ;
Abstract

A multiplex voltage measurement apparatus includes: (N+1) voltage detection terminals connected to N serially connected voltage sources; a capacitor which is charged with a voltage value of any of the N voltage sources; a first sample switch for selectively connecting odd-numbered voltage detection terminals among the (N+1) voltage detection terminals to a first terminal of the capacitor; a second sample switch for selectively connecting even-numbered voltage detection terminals among the (N+1) voltage detection terminals to a second terminal of the capacitor; a voltage measurement circuit for measuring the voltage value stored in the capacitor; a third sample switch for connecting the first terminal and the second terminal of the capacitor to the voltage measurement circuit; and a polarity controller for controlling the first and second sample switches such that one of the N voltage sources is selected while the third sample switch is open.


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