The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Apr. 29, 2002
Roman Mayr, München, DE;
Andreas Schellinger, München, DE;
Infineon Technologies AG, Munich, DE;
Abstract
A method for calibrating a test apparatus for parallel testing of a number of semiconductor memories, to a time-critical parameter, in which the components are positioned in batches at predetermined test positions and the parameter is measured. The various test positions give different measurement results since they are not identical. These different measurement results are compensated for by the following steps: The invention provides for a position-specific mean value M to be formed from batch parameter measurements at each test position, for a position-independent mean value M to be formed for the batch parameter measurements at all the test positions, and for a corrected mean value to be obtained for each test position by adding a correction value &dgr;, which is determined from the difference between the position-specific mean value M and the position-independent mean value M , to the position-specific mean value M .