The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Jan. 22, 2002
Hans Torp, Trondheim, NO;
Bjorn Olstad, Stathelle, NO;
Andreas Heimdal, Trondheim, NO;
Steinar Bjaerum, Trondheim, NO;
G.E. Vingmed Ultrasound AS, Horten, NO;
Abstract
An ultrasound system and method for calculation and display of tissue deformation parameters are disclosed. Tissue velocity may be estimated by filtering a received ultrasound signal at three center frequencies related to the second harmonic of the ultrasound signal, estimating a reference tissue velocity from the two signals filtered at the outside center frequencies and using the reference tissue velocity to choose a tissue velocity from tissue velocities estimated using the middle center frequency. Estimation of strain rate in any direction, not necessarily along the ultrasound beam, is disclosed. Quantitative tissue deformation parameters may be presented as functions of time and/or spatial position for applications such as stress echo. For example, strain rate or strain values for three different stress levels may be plotted together with respect to time over a cardiac cycle. Parameters derived from strain rate or strain velocity may be plotted with respect to various stress levels.