The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Jun. 01, 2001
Gaku Takeuchi, Tokyo, JP;
Naoki Nakazawa, Tokyo, JP;
Masahiro Shibutani, Tokyo, JP;
Katsuhiko Kobayashi, Tokyo, JP;
Kabushiki Kaisha Topcon, , JP;
Abstract
The invention provides an apparatus which detects light quantity distribution characteristics of a measuring target image projected to a fundus of an eye to be inspected and measures eye optical characteristics from the light quantity distribution characteristics. A projecting optical system has a light source and projects a measurement target to a fundus of an eye to be inspected by bundle of rays emitted from the light source, and a light receiving optical system condenses the bundle of rays reflected from the fundus of the eye. A photoelectric detector detects light quantity distribution characteristics of an image formed by the light receiving optical system, and an arithmetic unit measures eye optical characteristics of the eye based on a signal output from the photoelectric detector. A deflecting optical member for deflecting bundle of rays incident into both optical paths of the projecting optical system and the light receiving optical system is arranged so as to be rotatable.