The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
May. 27, 1999
Yuriy N. Pchelnikov, Cary, NC (US);
MTS Systems Corporation, Eden Prairie, MN (US);
Abstract
A device for measuring thin films and bulks is disclosed using slow-wave structures in electrodynamic elements to allow a decrease in frequency, an increase in sensitivity to electromagnetic parameters and accuracy of their monitoring. A method is also disclosed for monitoring of materials which includes placing an electrodynamic element near a monitored material and exciting an alternating electromagnetic field at an appropriate frequency to penetrate the monitored material concentrating in a small volume. Electromagnetic field parameters are then measured which are caused by the material parameters variation and said variations are converted to electromagnetic field parameters, the element being excited by an electromagnetic field in the form of at least one slowed electromagnetic wave.