The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2004

Filed:

Nov. 17, 1999
Applicant:
Inventors:

Chin-Long Chen, Fishkill, NY (US);

Douglas C. Bossen, Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 1/300 ;
U.S. Cl.
CPC ...
H03M 1/300 ;
Abstract

An apparatus and method is provided for correcting data words resulting from a package fail within a memory array in which coded data is divided into a plurality of multi-bit packages of b bits each. The coded data comprises n-bit words with r error correcting code bits and n-r data bits. The invention is capable of correcting one package which has suffered at least one hard failure. The invention correcting exploits single error correcting (SEC)-and double error detecting (DED) codes, requiring no additional check bits, which give a syndrome when the data word has suffered an error coming from at least one error in a package.


Find Patent Forward Citations

Chen, Chin-Long. (2004). Extended error correction for sec-ded codes with package error detection ability (U.S. Patent No. 6675341). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6675341

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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