The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2004
Filed:
Aug. 09, 2000
Farideh Golshan, Mountain View, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
Internally generating test vectors on a microchip during a burnin stage allows for better toggle coverage while not requiring external memory. A test access port (TAP) controller which accepts signals from a user and indicates to a linear feedback shift register (LFSR) that the microchip is in the burnin stage. The LFSR then may generate a set of pseudorandom values using a polynomial. The values are then shifted one per clock cycle into the internal scan chain of flips-flops on the chip, which toggles the internal state of the chip. New pseudorandom values are also generated one-by-one during the shift. By using this approach, the internal states of the chip are toggled without the use of an external memory for the burnin system.