The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2004
Filed:
Jun. 08, 1999
Verisity Ltd., Rosh Ha'ayin, IL;
Abstract
A system and method for testing the quality of a simulation model for the DUT (device under test) through temporal coverage of the testing and verification process. Temporal coverage examines the behavior of selected variables over time, according to a triggering event. Such a triggering event could be determined according to predefined sampling times and/or according to the behavior of another variable, for example. This information is collected during the testing/verification process, and is then analyzed in order to determine the behavior of these variables, as well as the quality of the simulation model for the DUT. For example, the temporal coverage information can be analyzed to search for a coverage hole, indicated by the absence of a particular value from a family of values.