The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2004
Filed:
Sep. 03, 1999
Jonathan A. Murray, Sussex, WI (US);
Jeffrey R. Immelt, Pewaukee, WI (US);
William A. Berezowitz, Greenfield, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
A method to be used during a product development procedure wherein the procedure includes a series of consecutive development phases and the product includes at least two critical to quality characteristics (CTQs). The method is for generating a confidence matrix which can be used to increase a product sigma through product design. A user initially provides product limits and thereafter provides additional development information during each consecutive development phase. During at least two of the development phases and for each CTQ, development information is used to determine a quality factor which is indicative of the probability that the product will be within the specified limits. Also, for each CTQ, a confidence factor is identified which is indicative of the probability that the quality factor is accurate. Then, quality factors, CTQs and confidence factors are arranged such that the CTQs and factors are correlated.