The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2004

Filed:

May. 01, 2002
Applicant:
Inventors:

Thomas J. Foth, Trumbull, CT (US);

Kenneth G. Miller, Bethel, CT (US);

Richard W. Heiden, Huntington, CT (US);

Brian M. Romansky, Monroe, CT (US);

Kwan Cheung Wong, Milford, CT (US);

Assignee:

Pitney Bowes Inc., Stamford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 ;
U.S. Cl.
CPC ...
G06F 7/00 ;
Abstract

A method for tagging the mail pieces in a mail tray and validating the integrity of the mail pieces in the tray. The method is accomplished by: determining the measurement of an edge of each mail piece that will be placed in a tray; determining the thickness of each mail piece that will be placed in the tray; determining the number of mail pieces that will be placed in the tray; calculating an incremental pattern dab that is going to be placed on the edge of each mail piece; placing a portion of the pattern on the edge of each mail piece that is going to form the mail pieces of the tray; and placing the mail pieces in the tray in an ordered manner so that the edges having dabs will be visible, and the dabs will form a pattern that indicates only the determined number of mail pieces are in the tray.


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