The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2004

Filed:

Aug. 16, 2002
Applicant:
Inventor:

Young-ho Yoo, Yongin, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 1/500 ;
U.S. Cl.
CPC ...
G03G 1/500 ;
Abstract

A method and an apparatus for detecting an error in an image scanning device that obtains image data upon scanning a document by using a light of beam radiated from a lamp, including a setting operation of obtaining initial reference values of a light quantity of the lamp and storing the obtained initial reference values in a memory, a storing operation of measuring the light quantity of the lamp during use of an image scanning system, obtaining measured values for comparing with the initial reference values, and storing the measured values in the memory, and a comparing/determining operation of determining whether to check the error to represent the lamp or a contaminant in an optical path by comparing the initial reference values with the measured values.


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Yoo, Young-ho. (2004). Method of and apparatus for detecting error in laser scanning device by determining whether a light source requires exchange or a contaminant is present in an optical path (U.S. Patent No. 6674977). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6674977

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