The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2004

Filed:

Sep. 06, 2000
Applicant:
Inventors:

Tsutomu Abe, Nakai-machi, JP;

Yutaka Egawa, Nakai-machi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A three-dimensional shape measuring apparatus capable of simultaneously obtaining range information and luminance information with high precision, independently of an object. A controller scans slit light, emitted from a laser beam source and shaped by a cylindrical lens, on an object plural times, by mirror surfaces of a polygon mirror, while causing the laser beam source to flash by using a laser beam source driver. The slit light is time-sequentially combined into projection pattern light having plural light stripes, respectively 3-level or more intensity-modulated, and the projection pattern light is projected onto the object. An image processor obtains the range information and the luminance information based on reflection light obtained by image pickup by first and second cameras.


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Abe, Tsutomu. (2004). Three-dimensional shape measuring apparatus (U.S. Patent No. 6674893). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6674893

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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