The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2004
Filed:
Jun. 14, 2002
Applicant:
Inventors:
Nikhil R. Taskar, Scarsdale, NY (US);
Rameshwar Nath Bhargava, Ossining, NY (US);
Paul J. Patt, Northborough, MA (US);
Assignee:
Nan Crystal Imaging Corporation, Briarcliff Manor, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/500 ;
U.S. Cl.
CPC ...
H01J 3/500 ;
Abstract
An X-ray imaging system utilizing a pixelated X-ray source and a X-ray imaging detector operated synchronously. The imaging system may be used in industrial and medical applications. The X-ray source and X-ray detector are synchronized such that a corresponding area of the X-ray detector is activated when the corresponding area of the X-ray source is emitting X-rays. Synchronized and adaptive emission and detection of the X-rays results in scatter rejection, improved image quality, and optimum exposure and dose reduction.