The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2004
Filed:
Oct. 12, 2001
John Patrick Kaufhold, Altamont, NY (US);
Jeffrey Wayne Eberhard, Albany, NY (US);
Dinko E. Gonzalez Trotter, Clifton Park, NY (US);
Bernhard Erich Hermann Claus, Niskayuna, NY (US);
John Eric Tkaczyk, Delanson, NY (US);
General Electric Co., Schenectady, NY (US);
Abstract
A method for estimating a material composition of an imaged object using an imaging system. The imaging system includes a radiation source and a digital detector. The method also includes scanning a plurality of calibration phantoms with varying material composition to acquire a plurality of reference calibration images, estimating an attenuation coefficient thickness product for each pixel in the reference calibration images, and estimating a material composition of a region of interest using the estimated pixelwise coefficient thickness product.