The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2004
Filed:
Apr. 20, 2000
Junichi Asada, Ibaraki, JP;
Seiji Nishiwaki, Osaka, JP;
Yuichi Takahashi, Neyagawa, JP;
Kenji Nagashima, Suita, JP;
Hiroaki Matsumiya, Neyagawa, JP;
Youichi Saitoh, Hirakata, JP;
Kazuo Momoo, Hirakata, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
To implement light quantity monitoring with high frequency responsivity and correction of astigmatic differences of a semiconductor laser with a simple configuration with fewer parts. Of the output from a semiconductor laser light source, a peripheral component is entered by a light reflection element into an anterior light monitoring photodetector formed in the vicinity of a semiconductor laser light source. Furthermore, the surface of the reflection sphere of the light reflection element is anamorphic, and thus condensed to an appropriate size on the photodetector without being focused, providing high frequency responsivity. Furthermore, the light reflection element is inclined at a predetermined angle to cancel out astigmatic differences of the optical semiconductor laser light source. In addition, the photodetector is placed so that reflected light is bent by an inclination of the light reflection element, reducing the amount of parallel displacement during adjustment of the light reflection element.