The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2004
Filed:
Aug. 06, 2002
Motohiko Suzuki, Kawasaki, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A laser microscope includes a beam scanning mechanism to scan a laser beam. An objective lens condenses the beam, and receives from a specimen the light by a linear and a non-linear phenomenon evoked by condensation of the beam, and a reflect light. A first beam splitter is arranged between the objective lens and the scanning mechanism, and separates the laser beam, the light by the linear phenomenon and the reflected light, from the light by the non-linear phenomenon. A first photodetector detects the light by the non-linear phenomenon. A second beam splitter is arranged between a light source and the scanning mechanism to separate the beam from the light by the linear phenomenon. A second photodetector detects the light passing a pinhole arranged at a position conjugative to the focal point of the objective lens among the light by the linear phenomenon and the reflected light.