The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2004
Filed:
Jul. 23, 2001
Yoichi Kawamorita, Kanagawa, JP;
Ryozo Fukuda, Ibaraki, JP;
Kazuya Tokuda, Ibaraki, JP;
Kenji Muranaka, Ibaraki, JP;
Shoshin Igarashi, Ibaraki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A pre-viewing inspection method and apparatus for inspecting an inspection article prior to visual inspection thereof, the inspection article being an electrophotographic member, such as an electrophotographic photosensitive member. The method (apparatus) comprises a defect signal detecting step (means) of detecting a defect signal based on a defect state of the inspection article, a detailed defect information generating step (means) of generating detailed defect information based on the defect signal detected in the defect signal detecting step, the detailed defect information including defect position information, and a detailed defect information visualizing step (means) of visualizing, on the inspection article, the detailed defect information generated in the detailed defect information generating step. The visualizing step (means) includes a printing step (means) executed with a laser light, wherein the detailed defect information visualizing step visualizes the detailed defect information by printing the detailed defect information on a longitudinal extension of a defect position on the inspection article, based on the defect position information.