The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2004
Filed:
May. 12, 2000
Applicant:
Inventors:
Stephen B. Segall, Ann Arbor, MI (US);
Juris Upatnieks, Ann Arbor, MI (US);
Assignee:
The Regents of the University of Michigan, Ann Arbor, MI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 2/106 ; G01B 1/126 ;
U.S. Cl.
CPC ...
G01C 2/106 ; G01B 1/126 ;
Abstract
A reconfigurable optical method and system for rapidly measuring relative angular alignment of flat surfaces are provided. The method and system can be used to rapidly and simultaneously measure the relative angular alignment of machined flat surfaces of a manufactured part. The system can measure parallelism, perpendicularity or angular alignment of multiple flat surfaces. The system can also be used to set up a range of reference angles to which machined surfaces can be compared.