The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2004
Filed:
Dec. 21, 2001
Peter H. Mui, Fairfax, VA (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
An adaptive optics system configured as an optical phase front measurement system which provides for relatively high resolution sampling as in holographic techniques but without the need for a reference beam. The optical phase front measurement system includes one or more lenses and a spatial light modulator positioned at the focal plane of the lenses and a camera which enables the phase front to be determined from intensity snapshots. The phase front measurement system allows for relatively long range applications with relatively relaxed criteria for the coherence length of the laser beam and the Doppler shift. As such, the system is suitable for a wide variety of applications including astronomy, long range imaging, imaging through a turbulent medium, space communications, distant target illumination and laser pointing stabilization.