The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6674518 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 06, 2004

Filed:

Jul. 01, 2002
Applicant:
Inventors:

Michael L. Asher, Green Grove Springs, FL (US);

Hossein Eslambolchi, Los Altos Hills, CA (US);

Charles C. Giddens, Conyers, GA (US);

Christopher Rollin Giles, Auburn, AL (US);

John Sinclair Huffman, Conyers, GA (US);

Harold Jeffrey Stewart, Alpharetta, GA (US);

Assignee:

AT&T Corp., New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

The present invention is directed to a method and apparatus for testing a fiber-optic cable. An Optical Time Domain Reflectometer (OTDR) is presented. Test signals are generated from the OTDR and received by the OTDR for processing. The received test signals are sampled and analyzed. The received test signals include reflectance spikes and a slope. A first-order derivative is taken of the received signal. The first-order derivative is then filtered to remove the reflectance spikes and the slope. Discontinuities in the filtered first-order derivative denote a fault in the fiber-optic cable.


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