The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2004

Filed:

Dec. 28, 1999
Applicant:
Inventors:

Suk-Joong Lee, Ichon-shi, KR;

Sang-Yeon Kim, Ichon-shi, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 ;
U.S. Cl.
CPC ...
G06K 9/40 ;
Abstract

A method for detecting and correcting a defective pixel in an image sensor including an M(row line)×N(column line) unit pixels, M and N being positive integers, includes a first step of electrically scanning photoelectric charges generated from unit pixels of a first row line for a first integration time and storing a first data corresponding to the photoelectric charges, a second step of electrically scanning photoelectric charges generated from the unit pixels of the first row line for a second integration time and storing a second data corresponding to the photoelectric charges, a third step of comparing the first data and the second data one another, if the first data is different from the second data, an error signal is generated and then a corresponding address of the unit pixel is stored as a defective pixel address, a fourth step of repeating the first to the third step to an Mth line by increasing an address by one, and a fifth step of comparing an address of a unit pixel to be read with the defective pixel address, if the address of the unit pixel is equal to the defective pixel address, a correction operation is performed to generated a corrected data.


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