The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2004
Filed:
Jul. 26, 2002
Chizuru Inoshita, Tokyo, JP;
Kazuo Aoki, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
In a method of testing a semiconductor integrated circuit, setting of a logical state of elements that constitute a semiconductor integrated circuit to be measured is sequentially changed. The current from a static-time power source current passing through the elements is measured several times while the settings are changed. Any two consecutive currents are obtained. When the difference between the two consecutive current exceeds a threshold value it is determined that the semiconductor integrated circuit is defective.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile