The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2004
Filed:
May. 04, 2000
Applicant:
Inventors:
Assignee:
Carl Zeiss Jena GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/740 ;
U.S. Cl.
CPC ...
G02B 2/740 ;
Abstract
Near-field optical microscope with a probe tip which is arranged on one side of a light-transmitting specimen and moved in a scanning manner. The probe tip serves as a point light source. Optics for collecting light transmitted through the specimen and transmitting it to a detection unit or for collecting illumination light are provided on the other side of the specimen. The movement of the probe tip is adapted to on the detection side, or the probe serves to detect specimen light. A detection unit is arranged following the probe in the direction of illumination, and a scanning illumination adapted to the probe movement is carried out on the other side of the specimen.