The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2004

Filed:

Dec. 22, 1998
Applicant:
Inventors:

Kiyoji Hashimoto, Okayama, JP;

Masanori Matsumoto, Ibara, JP;

Masaru Fujimoto, Ibara, JP;

Mamoru Shiratori, Tokyo, JP;

Masato Ichikawa, Tokyo, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/500 ;
U.S. Cl.
CPC ...
G01N 3/500 ;
Abstract

In order to provide an automatic testing apparatus with improved reliability of test results, capable of conducting automatically such operations as sterile testing, microorganism limit testing, insoluble particulate measurement testing, divided portion testing for chemical analysis and chemical reaction testing, etc., and capable of accommodating changes in the specimen or the test container with each sample as well as changes in operating procedures with each sample so as to eliminate the possibility of human error and prevent contamination of the operating environment by human hands, the automatic testing apparatus of the present invention prepares a sample by mounting a set of various pieces of equipment including the specimen or test containers required to be changed with every sample atop a same work base and providing that work base as a unit to within the operating range of a robot, with the robot then handling the various pieces of equipment atop the work base to prepare the sample.


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