The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2003
Filed:
Feb. 23, 2001
Sadayuki Matsumiya, Kawasaki, JP;
Naoki Morita, Yamatokoriyama, JP;
Yasushi Fukaya, Niwa-gun, JP;
Kazuo Yamazaki, El Macero, CA (US);
Other;
Abstract
In the present invention, for an NC program for controlling a machine tool, information for machining quality required by a machine tool is prewritten in the program. A measurement program for measuring the machining quality of the workpiece using a measuring machine is produced by analyzing the NC program. The machining quality of the workpiece is measured by the measurement program and the measuring machine. The machining quality of the workpiece can be judged by comparing the measurement results and the machining quality information included in the NC program. By utilizing this quality judgement, simple and effective system control can be achieved when a system such as CIM (Computer Integrated Manufacturing) is constructed in cooperation with other machine tools.