The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2003
Filed:
Apr. 17, 2002
Nigel Copner, Fremont, CA (US);
Frank Liang, San Jose, CA (US);
Robert Maaskant, King City, CA;
Keith Beckley, King City, CA;
A. Tino Alavie, Richmond Hill, CA;
JDS Uniphase Corporation, San Jose, CA (US);
Abstract
An optical performance monitor having a tunable fiber grating sandwiched between the first and second reflective surfaces of a fiber etalon provides high sensitivity, while simultaneously monitoring an optical data signal. Individual channels within the optical data signal are monitored by tuning the fiber grating over the wavelength range of the optical data signal to measure an intensity of each channel. As the tunable grating scans the wavelength range of interest, it simultaneously changes the resonant cavity length of the etalon, thus allowing the etalon to effectively monitor the tunable grating with a wavelength outside the wavelength range of the optical data signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile