The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2003
Filed:
Dec. 15, 1999
Applicant:
Inventor:
Hay Yeung Cheung, Holmdel, NJ (US);
Assignee:
AT&T Corp., New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 1/266 ;
U.S. Cl.
CPC ...
H04L 1/266 ;
Abstract
An apparatus and method of establishing a communication connection is provided. A one-way delay is not approximated by an average of a two-way delay calculation. Instead, a first time difference is determined based on a round-trip delay of a transmission over a packetized network and a circuit-switched network. A second time difference is also determined based on a round-trip delay of a transmission over the circuit-switched network. Then a delay value is calculated based on the two time differences.
Cheung, Hay. (2003). Method for measuring transmission delay (U.S. Patent No. 6671261). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6671261
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile