The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2003

Filed:

Mar. 08, 2001
Applicant:
Inventor:

Georg Flatscher, Schneizlreuth, DE;

Assignee:

Johannes Heidenhain GmbH, Traunreut, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/00 ; G02B 5/28 ;
U.S. Cl.
CPC ...
G02B 5/00 ; G02B 5/28 ;
Abstract

A reflective measuring scale graduation, as well as a method for manufacturing the same are described. The reflective measuring scale graduation includes first and second subdivisions having different reflection properties, which extend in at least one first direction on a reflecting substrate. The highly reflecting first subdivisions are made of a plurality of partial layers having different indices of refraction and function as an interference filter. The low reflecting second subdivisions are composed of at least one absorber layer on the substrate.


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