The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2003

Filed:

Sep. 21, 2000
Applicant:
Inventors:

Bernard Braunecker, Rebstein, CH;

Beat Aebischer, Heerbrugg, CH;

Raphael Appius, Berneck, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/114 ;
U.S. Cl.
CPC ...
G01B 1/114 ;
Abstract

The invention relates to a method for determining the spatial and rotational positions of an object. With the assistance of an imaging optical system, the object is mapped and detected on a high-sensitivity resolution optoelectronic detector. The location parameter of the object, such as the position vector ({overscore (r)} ), the direction vector ({overscore (&ngr;)}) of the object axis, and the angle (&kgr;) of rotation of the object around the object axis is determined from the planar position of the mapped object structures in the coordinate system (X , Y ) of the detector by means of geometric optical relationships and mathematical evaluation methods. With this, the spatial position of the object is determined in a quick and contactless manner.


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