The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2003
Filed:
Apr. 13, 2000
Applicant:
Inventors:
Thomas A. Wavering, Blacksburg, VA (US);
Scott A. Meller, Blacksburg, VA (US);
Jason W. Borinski, Blacksburg, VA (US);
Wade J. Pulliam, Blacksburg, VA (US);
Patrick M. Russler, Raleigh, NC (US);
Assignee:
Luna Innovations, Inc., Blacksburg, VA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract
The present invention is directed toward an interferometric sensor that permits the simultaneous measurement of a change in more than one environmental condition. The interferometric sensor comprises an optical fiber and a plurality of sensing regions positioned in an operable relationship to the optical fiber. Each sensing region has partially reflective boundaries and produces an interferometric signal.