The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2003
Filed:
Aug. 15, 2002
David L. Herrick, Mont Vernon, NH (US);
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Abstract
The determination of the geographical location of a signal emitter by the coherent, time integrated measurement of received signal wavefront phase differences through a synthetic aperture and the reconstruction of the wavefront of the received signal. The location of an emitter is determined by coherently measuring the phase gradient of an emitted signal at measurement points across a measurement aperture. Each measured phase gradient is integrated to determine a vector having a direction from the measurement point to the signal emitter and an amplitude proportional to the received signal. A figure of merit is determined for each possible location of the signal emitter by integrating each vector with respect to a propagation path between the measurement point of the vector and the possible location of the signal emitter, and the location of the signal emitter is determined as the possible location of the signal emitter having the highest figure of merit. The measurement aperture is generated by motion of a receiving aperture along the path and the receiving aperture is generated as by synthetic aperture methods. The receiving aperture may be mounted on an airborne platform and a positional towed body.