The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2003
Filed:
Oct. 22, 2001
Stefan Dietrich, Türkenfeld, DE;
Patrick Heyne, München, DE;
Thilo Marx, Villingen-Schwenningen, DE;
Sabine Kieser, Hausham, DE;
Michael Sommer, München, DE;
Thomas Hein, München, DE;
Michael Markert, Augsburg, DE;
Torsten Partsch, Chapel Hill, NC (US);
Peter Schroegmeier, München, DE;
Christian Weis, Germering, DE;
Infineon Technologies AG, Munich, DE;
Abstract
Integrated circuits, in particular memory chips of the DDR SDRAM type, are tested in a parallel manner. In order to prevent the circuits from being driven relative to one another during a test operation, an input terminal that is already connected to a channel of an automatic test machine anyway is connected to a switching device, by which the output drivers can be turned off in a manner dependent on the control signal that can be fed in at the input terminal. The switching device preferably contains a demultiplexer and also a multiplexer. The demultiplexer can be driven by a test control signal that is additionally generated besides the test control signal. The input terminal is connected to a tester channel anyway during test operation, with the result that no additional external outlay arises.