The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2003

Filed:

Nov. 10, 2000
Applicant:
Inventors:

Jurgen M. Schulz, Pleasanton, CA (US);

Tai Quan, San Jose, CA (US);

Brian L. Smith, Sunnyvale, CA (US);

Michael J. Grubisich, San Jose, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G01R 3/102 ; H03B 2/100 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G01R 3/102 ; H03B 2/100 ;
Abstract

A digital process monitor for measuring the performance of an integrated circuit has been developed. The digital process monitor includes: a ring oscillator that generates a series of clocked pulses, and a ripple counter that counts the clocked pulses. The count is measured for a prescribed period of time and the count corresponds to the performance of the integrated circuit.


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