The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2003
Filed:
Dec. 10, 1999
Ronald Bruce Baker, Wake Forrest, NC (US);
David Bruce Kumhyr, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system and program for determining a test case selection for a software application. Multiple risk values are assigned to each of the test cases of a software application, wherein the multiple risk values represent multiple types of risks associated with the software application not performing each function. An acceptable level of risk is designated. Only a subset of the test cases of the software are selected to test, wherein the subset comprises the test cases assigned risk values that exceed the acceptable level of risk, such that a risk-based test case selection for the software application is determined.