The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2003
Filed:
Sep. 11, 2001
Christopher Anthony Hicks, Boulder, CO (US);
Mark A. Norris, Louisville, CO (US);
Matti Veli Tapani Huiku, Espoo, FI;
Scott James Charles Light, Boulder, CO (US);
Datex-Ohmeda, Inc., Madison, WI (US);
Abstract
A photoplethysmographic system and method is provided to identify compatible sensors to monitors and/or for determining sensor attributes. The improved system includes a signal generation means for providing an interrogation signal, an identifying means coupled between a first and second sensor terminal operable to produce multiple outputs upon application of the interrogation signal in two modes of operation, and a processor to interpret the outputs. When the interrogation signal is applied to a sensor terminal in a first mode, a first output is obtained. Upon applying the same interrogation signal to the sensor terminal in a second mode, a second output is obtained. The first and second outputs may then be utilized by the processor comprising, for example, a photoplethysmographic monitor to yield enhanced sensor information. The disclosed method may be carried out utilizing the inventive photoplethysmographic system.