The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2003
Filed:
Jun. 07, 2000
Bert L. A. Verdonck, Eindhoven, NL;
Sherif Makram-Ebeid, Dampierre, FR;
Sylvain Devillers, Paris, FR;
Philippe Lacour, Le Perreux sur Marne, FR;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
A method of deriving geometrical data of a structure from an image of the structure comprises the selection of marker points in the image. A typical contour is associated with the marker points and the geometrical data is calculated from the typical contour. According to the invention, correctness values are associated with the marker points. The correctness values indicate the reliability of the correspondence of the marker points to typical (anatomical) features in the structure. Furthermore, a cost function is associated with a typical contour, which cost function is dependent on the correctness values of the marker points. The typical contour is arranged in such a manner that the cost function reaches an optimum value, such as a local maximum or minimum value. The method is particularly suitable for deriving geometrical data, such as angles and distances concerning the spinal column of a patient. Preferably, some clearly recognizable marker points are manually indicated and derived marker points are obtained by interpolation between the manually indicated marker points.