The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2003
Filed:
Feb. 25, 2002
Applicant:
Inventors:
Isamu Kobayashi, Kasugai, JP;
Yoshiharu Kato, Kasugai, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/04 ;
U.S. Cl.
CPC ...
G11C 7/04 ;
Abstract
A semiconductor device, a testing method and a refresh control method having a temperature detecting function to detect a predetermined temperature with little dispersion and to optimize the acting state in accordance with the predetermined temperature detected. The semiconductor device includes at least a memory cell, a refresh control circuit for switching the refresh period tREF of the memory cell, and a temperature detecting unit to be biased with a bias voltage VB+ coming from a voltage bias unit including a reference unit and a regulator unit.