The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2003
Filed:
Aug. 17, 1999
Peter Larsson, Västra Frölunda, SE;
Anders Larsson, Göteborg, SE;
Erland Max, Västra Frölunda, SE;
Volvo Car Corporation, Göteborg, SE;
Abstract
Method and apparatus for measuring and quantifying surface finishing defects on a coated opaque test surface including utilizing at least one light source, at least one camera, and a central unit that has image analysis capability. At least two partial images are recorded with the camera while illuminating the opaque test surface using the light source. The two partial images are produced from the test surface by differing the angle of incident light for different partial images. The two partial images are processed by the central unit thereby establishing a difference image that is analyzed to quantify the degree of surface finishing defects on the coated opaque test surface. Optionally, the central unit further has operational control capabilities over at least one of the light sources and camera.