The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2003
Filed:
Feb. 16, 2001
William P. Bouvier, New Boston, NH (US);
Timothy P. White, New Boston, NH (US);
John J. Merva, Weare, NH (US);
Robotic Vision Systems, Inc., Canton, MA (US);
Abstract
A miniature inspection system for observing an object. The system comprises a camera ( ) defining an optical axis ( ) defined between the camera ( ) and the object when located at the object inspection location. A ring light ( ) is located concentrically with respect to and along the optical axis at a location between an entrance aperture of the camera ( ) and the object, when located at the object observing location. A field lens ( ) is located along the optical axis at a location between the camera ( ) and the object, when placed at the object observing location. A mirror or a penta-prism ( ) may be located along the optical axis, between the camera ( ) and the field lens, so that light reflected from the object along the optical axis is reflected by either the mirror or the penta-prism ( ) toward the entrance aperture of the camera ( ). An illumination source ( ), may be also provided to supply illumination along the optical axis of the system.