The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2003
Filed:
Apr. 19, 2002
Jun Sasaki, Kyoto, JP;
Yasunori Kawamura, Kyoto, JP;
Rohm Co., LTD, Kyoto, JP;
Abstract
A semiconductor device equipped with a DAC channel has a test pattern generation means for storing and generating test patters, and a test clock input terminal. The test pattern generation means generates a test digital signal representing a test pattern based on the high-frequency (e.g. 135 MHz) test clock input to the test clock input terminal. The test digital signal is supplied to the input end of the DAC channel. Using the test digital signals supplied from the test signal generation means, the semiconductor device can be tested in various high-frequency test modes without any tester outputting high-frequency test signals.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile