The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2003

Filed:

Feb. 15, 2001
Applicant:
Inventors:

Terrence A. McMahon, Hudson, WI (US);

Ray V. Rigles, Bloomington, MN (US);

David M. Gray, Bloomington, MN (US);

William P. Wood, Waconia, MN (US);

Assignee:

Seagate Technology LLC, Scotts Valley, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/312 ; G11C 2/900 ;
U.S. Cl.
CPC ...
G01R 3/312 ; G11C 2/900 ;
Abstract

A head testing apparatus is provided for testing an output of a magnetic data recording head. The apparatus includes first and second tester input terminals for coupling to the head, first and second input stages and an AC-coupled differential amplifier. The first input stage has a first buffer input, which is coupled to the first tester input terminal, a first buffer output and a plurality of parallel-connected buffer amplifiers coupled between the first buffer input and the first buffer output. The second input stage has a second buffer input, which is coupled to the second tester input terminal, a second buffer output and a plurality of parallel-connected buffer amplifiers coupled between the second buffer input and the second buffer output. The AC-coupled differential amplifier has first and second amplefier inputs coupled to the first and second buffer outputs through first and second capacitors, respectively, and has a measurement output.


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