The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2003
Filed:
Apr. 24, 2000
Applicant:
Inventors:
Yadhu N. Gopalan, Redmond, WA (US);
Xiongjian Fu, Redmond, WA (US);
David M. Sauntry, Redmond, WA (US);
James A. Stulz, Redmond, WA (US);
Assignee:
Microsoft Corporation, Redmond, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract
Data capture and analysis for debugging embedded systems is disclosed. On a target, there is at least one data collector, each of which publishes predetermined data of the target, and a collection manager for managing the data collectors. On a host, there is at least one viewer, each of subscribes to the predetermined data of a data collector, for processing thereof, and a viewer manager for managing the viewers. Data collectors and viewers can be added, such that an extensible data capture and analysis embedded system architecture is provided.