The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2003
Filed:
Jun. 29, 2000
Applicant:
Inventor:
Yoshiaki Nishio, Osaka, JP;
Assignee:
Keyence Corporation, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 ; G06K 9/64 ; G06K 9/68 ;
U.S. Cl.
CPC ...
G06K 9/62 ; G06K 9/64 ; G06K 9/68 ;
Abstract
A pattern recognition matching processing method and apparatus uses expansion processing with dictionary data as a matching candidate (pattern image). Contraction processing may be performed for the pattern image, and a differential image between the expanded and contracted images can be found. A mask image is prepared based on the differential image, and matching processing of the image containing a character to be recognized with the pattern image is performed with respect to pixels in an area other than the prepared mask image.
Nishio, Yoshiaki. (2003). Pattern matching method and apparatus (U.S. Patent No. 6665441). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6665441
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