The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2003
Filed:
Sep. 01, 1999
Luigi Stringa, Bd de Belgique, MC;
De La Rue Giori S.A., Lausanne, CH;
Abstract
The invention relates to a process for producing by electronic means a model for automatically inspecting the print quality on deformable objects. The model is firstly produced by capturing with an electronic camera (CCD for example) the images of a set of sheets whose print quality is regarded as acceptable; the images are stored so as to produce a first reference image, together with the relevant densitometric tolerance limits. This reference image is thereafter divided into a multitude of sub-images by superimposing a grid with very small mesh cells. During inspection, the distances between the nodes of the grid are measured on the image to be inspected: this therefore produces an elastic modification of the model, which is such as to make the distances between the nodes the same as in the image to be inspected. The image to be inspected is thus verified with respect to the modified reference (model) by using any of the standard inspection techniques.