The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2003

Filed:

Feb. 25, 2000
Applicant:
Inventors:

Satoshi Sato, Kanagawa, JP;

Shintaro Suzuki, Kanagawa, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 1/16 ; H04J 3/14 ;
U.S. Cl.
CPC ...
H04J 1/16 ; H04J 3/14 ;
Abstract

In a load testing apparatus, before the load test, three processor elements are combined, without overage or shortage, with a source processor element and a destination processor element as one pair, and the transmission time between the processor elements for each pair is measured. During the load test, packets are sent at a time from the source processor element to the corresponding destination processor element in the same pair, and the transmission time for each pair is measured. The transmission time measured for each pair in the load test is compared with a corresponding expected value data so as to evaluate the performance.


Find Patent Forward Citations

Sato, Satoshi. (2003). Load testing apparatus, computer readable recording medium for recording load test program, fault diagnosis apparatus, and computer readable recording medium for recording fault diagnosis program (U.S. Patent No. 6665268). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6665268

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…