The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2003

Filed:

Nov. 13, 2001
Applicant:
Inventors:

Daniel M. Mittleman, Houston, TX (US);

Jon L. Johnson, Plano, TX (US);

Assignee:

WM. Marshurice University, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

A broadband imaging system is disclosed that provides greatly enhanced depth resolution through the use of phase shift interferometry. The system may comprise a transmitter, a splitter, a phase inverter, and a receiver. The transmitter transmits a signal pulse that is split into a measurement pulse and a reference pulse. The measurement pulse is applied to a sample, and a relative phase shift of approximately &pgr; radians is introduced between the measurement pulse and the reference pulse by the phase inverter. The measurement and reference pulses are then recombined to form a combined pulse that is detected by the receiver. The phase inverter may be a simple lens that introduces a Gouy phase shift by passing the measurement or reference pulse through a focal point. In this manner, a background-free measurement is provided, which provides a greatly enhanced sensitivity to small changes in the measurement waveform, regardless of origin.


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