The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2003
Filed:
Oct. 18, 2001
Method and device for detecting variations of optical properties in a sample in and analysis process
Applicant:
Inventors:
Assignee:
Stago International, , FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 2/100 ;
U.S. Cl.
CPC ...
G01B 2/100 ;
Abstract
The invention concerns a method which consists in performing for a time interval ranging between 1 ms and 10 ms a first turbidimetric measurement using a first light pulse originating from a first source (SL ) emitting in a first frequency range, a second measurement of intensity transmitted in response to a second light pulse originating from a second source (SL ) emitting in a second frequency range and, optionally determining the fluorescence of the sample. The invention is applicable to a biological analysis process as well as to hemostatic analyses.