The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2003
Filed:
Nov. 14, 2002
Noriaki Shirai, Kariya, JP;
Katsuhiro Morikawa, Nagoya, JP;
Yoshie Samukawa, Kariya, JP;
Keiji Matsuoka, Kariya, JP;
Toyohito Nozawa, Kariya, JP;
Denso Corporation, Kariya, JP;
Abstract
A method and apparatus of measuring a distance to a reflection object is disclosed. A sensitivity time control (STC) process is applied to a received signal from the reflection object to provide an STC-processed signal. The radar apparatus includes a controller. The controller obtains a quantity corresponding to the distance from a transmission time of the transmission signal and a detection time of the STC-processed signal. The quantity is corrected by using a first correction value associated with the intensity of the STC-processed reflection signal to provide a corrected quantity. The corrected quantity is further corrected by using a second correction value associated with the corrected quantity and the intensity of the STC-processed reflection signal to correct the error regardless of the intensity of the STC-processed reflection signal.