Integrated circuit with test interface

Abstract

Integrated circuit with a test interface for testing a conductive connection between a supply pad and a supply of a functional block in the integrated circuit. A current test circuit has test inputs coupled to a first and a second point along the conductive connection, for comparing a voltage across the test inputs with a threshold. The current test circuit contains a threshold shifting circuit for shifting the threshold to a shifted value dependent on a voltage across the test inputs when the threshold shifting circuit is active. Testing is executed in two steps, making the threshold shifting circuit active when a first voltage is applied across test inputs and comparing a second voltage at the test input with the shifted threshold. One of the first and second voltage is a voltage drop across the connection when the integrated circuit is set to draw current along a connection, the other one of the first and second voltage is a reference voltage. In an embodiment the integrated circuit has a shunt circuit to provoke current through the conductive connection under test in parallel with current through the functional block.