The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2003
Filed:
Jul. 15, 2002
Lydia Baril, Sunnyvale, CA (US);
Kenneth Donald Mackay, San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system for measuring the magnetostriction coefficient &lgr; of a sample material applied to a substrate element fixed at one end leaving the other end free to be deflected. An external rotating magnetic field of rotation frequency f and intensity H is applied to the cantilever substrate element the amplitude A of the deflection of the free end is measured at each of a plurality of rotation frequency harmonics {f } by, for example, using a plurality of lock-in amplifiers. The harmonic deflection amplitudes {A } are combined to determine the magnetostriction coefficient &lgr; of the sample material. At an H equal to the sample saturation moment M and assuming a 15 Oe sample anisotropy H and coupling bias H , the error in the saturation magnetostriction coefficient &lgr; measured according to this invention may be reduced by 80% to 90% over the error seen when using only the second harmonic deflection amplitudes A .